Date & Time: 

   2023 / 11 / 17 (Fri) 14:20 - 16:20

 

Location: 

   Delta Building R216, NTHU

 

Speaker: 

   許舒涵 教授

   國立成功大學 資訊系

 

Topic: 

   Semiconductor Reliability Analysis Using Online Monitoring and Accelerated Testing

 

Abstract: 

  Semiconductor reliability analysis is crucial to ensure that electronic products perform properly and function within the intended design criteria. Monitoring circuits during usage ensures safety and performance for automotive, industrial, and medical applications. Accelerated testing is crucial for reliability forecasts. Front-end time-dependent dielectric breakdown (FEOL TDDB) is one of the most important failure mechanisms for semiconductor devices, which is caused by the buildup of traps in the dielectric region during usage. In this talk, I will describe methodologies to estimate the wearout parameters of FEOL TDDB for SRAMs using on-line data collected during operations and the investigation of the factors affecting accelerated testing.

 

Autobiography: 

  Shu-han Hsu has an interdisciplinary background in the field of semiconductor fabrication, circuits, machine learning and failure analysis. She was previously a research and development integration engineer at Taiwan Semiconductor Manufacturing Company Limited (TSMC). She received a M.S. degree in photonics and optoelectronics from National Taiwan University and a M.S. in materials engineering from Purdue University. She received her Ph.D. in electrical and computer science engineering from Georgia Institute of Technology.